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teach the fundamentals of Atomic Force Microscopy (AFM), it is useful to have a set of notes that interested students can work through in an independent, self-study mode at their own pace, without the benefit of a
Atomic Force Microscopy HOW DOES THE AFM WORK? AFM provides a 3D profile of the surface on a nanoscale, by measuring forces between a sharp probe (<10 nm) and surface at very short distance (0.2-10 nm probe-sample separation). The probe is supported on a flexible cantilever. The
Outline. Part 1: AFM, instrumentations, principles and mode of operations. SPM: The principle of a local probe. Scanning Tunneling Microscopy (STM): the basis for the AFM. Atomic Force Microscopy (AFM): basic ideas and concepts. Part 2: Applications to Nanoscale Characterizations, Manipulation and Fabrications. “Physical Applications”:
Lecture 10: Basics of Atomic Force Microscope (AFM) History and background of AFM; Basic component of an AFM; Tip-Sample interactions and feedback mechanism; Atomic force and different scanning modes; AFM tips and resolution.
Microscope at different length scales. Atomic Force Microscope has among the widest range of spatial resolution. Its unique in its ability to magnify in the 3rd dimension (Z) as well. Downside being, any scanning area greater than 100 practical is largely not.
Atomic Force Microscopy (AFM) 1. General Principle The Atomic Force Microscope is a kind of scanning probe microscope in which a topographical image of the sample surface can be achieved based on the interactions between a tip and a sample surface. The atomic force microscope was invented by Gerd Binning et al. in 1986 at IBM Zurich based on ...
• Scanning Probe Microscopy • Atomic Force Microscopy – General set-up & operation modes – Sample preparation • Applications in life science – Imaging mode –Force-distancemode •Conclusion
