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The XRD analysis of the prepared sample of TiO 2 nanoparticles was done using a Bruker make diffractometer, Cu-Kα X-rays of wavelength (λ)=1.5406 Å and data was taken for the 2 θ range of 10° to 70° with a step of 0.1972°.
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XRD peaks observed at 2θ corresponding to 110°, 101°, 200°, 111°, 210°, 211°, 220°, 002°, 310°, and 301° plane indices indicated the crystalline structure of synthesized TiO2 NPs.
These observations closely align with the TiO 2 -ICDD-International Centre for Diffraction Data file No. 21-1272, confirming the nanofiller's composition and phase characteristics.
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