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23 Ιουλ 2019 · X-ray diffraction (XRD) patterns for samples of nanoparticles having different sizes and shapes can look different, and careful analysis of the XRD data can provide useful information and also help correlate microscopic observations with the bulk sample.
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The XRD pattern for bulk CdS, simulated from...
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The XRD analysis of the prepared sample of TiO 2 nanoparticles was done using a Bruker make diffractometer, Cu-Kα X-rays of wavelength (λ)=1.5406 Å and data was taken for the 2 θ range of 10° to 70° with a step of 0.1972°.
We report about multilayer (TiO2)1-x(WO3)x thin films with various tungsten oxide concentration deposited on glass substrate via pulsed laser deposition (PLD) technique method.
FTIR reinforces the intended composite formation with significant bands allocation. Optical bandgaps for PMMA/CeO2 and PMMA/TiO2 are 2.91 and 3.15 eV for direct transitions, respectively.
The synthesized Er³⁺/TiO2 and Ni²⁺/TiO2 catalysts were characterized using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), energy dispersive X-ray (EDX),...
13 Οκτ 2021 · X-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well as the interpretation of the resultant patterns and scans.
X-ray diffraction (XRD) is a versatile, non-destructive analytical method to analyze material properties like phase composition, structure, texture and many more of powder samples, solid samples or even liquid samples.
