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By controlling the calcination temperature, the different structures of TiO2 (anatase and rutile) have been achieved which is considered a new technique for phase transformation.
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By controlling the calcination temperature, the different...
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Download scientific diagram | XRD patterns of (a) TiO 2 anatase (JCPDS card no. 21-1272), (b) TiO 2 rutile (JCPDS card no. 21-1276), and (c) TiO 2 brookite (JCPDS card no. 29-1360).
The synthesized Er³⁺/TiO2 and Ni²⁺/TiO2 catalysts were characterized using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), energy dispersive X-ray (EDX),...
The XRD analysis of the prepared sample of TiO 2 nanoparticles was done using a Bruker make diffractometer, Cu-Kα X-rays of wavelength (λ)=1.5406 Å and data was taken for the 2 θ range of 10° to 70° with a step of 0.1972°.
Fortunately, X-ray difraction (XRD) provides such a tool, and is arguably the most useful and versatile technique in the characterisation of thin films.1 XRD can be used to obtain the following infor-mation on thin films: Crystalline phase and lattice parameters. Degree of crystallinity.
The prepared samples were characterized by Fourier transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD), and scanning electron microscopy (SEM), and tested for the removal of the...
X-ray diffraction (XRD) is a versatile, non-destructive analytical method to analyze material properties like phase composition, structure, texture and many more of powder samples, solid samples or even liquid samples.
