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1. www.researchgate.net › figure › XRD-patterns-for-rutile-anatase-and-mixed-TiO2XRD patterns for rutile, anatase, and mixed TiO2 phases. The...

   www.researchgate.net › figure › XRD-patterns-for-rutile-anatase-and-mixed-TiO2

   Download scientific diagram | XRD patterns for rutile, anatase, and mixed TiO2 phases. The JCPDS #75-1537 for TiO2 is shown as a reference.

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     Download scientific diagram | XRD patterns for rutile,...

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2. arxiv.org › pdf › 1307Titanium dioxide (TiO2) Nanoparticles - XRD Analyses – An Insight

   arxiv.org › pdf › 1307

   The XRD analysis of the prepared sample of TiO 2 nanoparticles was done using a Bruker make diffractometer, Cu-Kα X-rays of wavelength (λ)=1.5406 Å and data was taken for the 2 θ range of 10° to 70° with a step of 0.1972°.

3. www.researchgate.net › figure › The-XRD-pattern-of-the-structure-of-TiO2The XRD pattern of the structure of TiO2 nanoparticles

   www.researchgate.net › figure › The-XRD-pattern-of-the-structure-of-TiO2

   X-ray diffraction (XRD) tool was applied to confirm the crystal structures of ZnMgS and TiO2, and the resulting crystal structures are hexagonal & anatase, respectively.

4. www.researchgate.net › figure › XRD-patterns-of-TiO2-and-Pt-TiO2-nanosheet-filmsXRD patterns of TiO2 and Pt-TiO2 nanosheet films.

   www.researchgate.net › figure › XRD-patterns-of-TiO2-and-Pt-TiO2-nanosheet-films

   Pt/TiO2 (PC500) photocatalysts with different amount of Pt (0.5–3.0 wt.%) deposited on commercial support (Al2O3 foam) were characterized in detail by X-ray powder diffraction, nitrogen ...

5. link.springer.com › article › 10Back-to-Basics tutorial: X-ray diffraction of thin films

   link.springer.com › article › 10

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   13 Οκτ 2021 · X-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well as the interpretation of the resultant patterns and scans.

6. profex.doebelin.org › wp-content › uploadsLesson 1: XRD and Rietveld Refinement - profex.doebelin.org

   profex.doebelin.org › wp-content › uploads

   Summary: Rietveld Basics. Calculate XRD pattern from model structure. Minimize differences between calculated and measured pattern. Accurate mathematical description of peak profile required: Classical Rietveld approach: Fit a peak shape function (PV or similar) to reference pattern.

7. ywcmatsci.yale.edu › sites › defaultBack-to-Basics tutorial: X-ray diffraction of thin films - Yale...

   ywcmatsci.yale.edu › sites › default

   Fortunately, X-ray difraction (XRD) provides such a tool, and is arguably the most useful and versatile technique in the characterisation of thin films.1 XRD can be used to obtain the following infor-mation on thin films: Crystalline phase and lattice parameters. Degree of crystallinity.